X-ray Fluorescence Spectrometer (XRF)

Details

X-ray Fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of a sample. It involves irradiating a sample with a beam of X-rays, causing the elements within the sample to emit characteristic X-rays. These emitted X-rays can then be analyzed to identify the types of elements present (qualitative analysis) and their relative abundance (quantitative analysis)

Sample Analysis Services

• Analytical Services: Qualitative analysis/Semi-quantitative analysis (from B to U), Quantitative Analysis

Material Types: Solids, powders, and chemicals

• Material Analysis: Conductive and non-conductive materials (e.g., iron, alloys, aluminum)

Usage Limitations

• Holder size: Ø 10, 20, 30 mm
• Samples must be oil-free